Aehr Receives Follow-On Order for Fully Automated Wafer-Level Burn-In Systems Powering AI Optical I/O and Data Center Interconnects

Aehr Receives Follow-On Order for Fully Automated Wafer-Level Burn-In Systems Powering AI Optical I/O and Data Center Interconnects

https://www.aehr.com/2026/03/aehr-receives-follow-on-order-for-fully-automated-wafer-level-burn-in-systems-powering-ai-optical-i-o-and-data-center-interconnects/

Publish Date: 2026-03-03 07:35:00

Source Domain: www.aehr.com

• Aehr Test Systems announced a follow-on purchase order from its lead silicon photonics customer, indicating increasing production volumes due to rising demand for optical connectivity for next-generation AI training and infrastructure.
• The order includes one new ultra-high-power FOX-XP™ wafer-level test and burn-in system, and an upgrade of an existing FOX-XP system, both configured to test up to nine 300mm wafers in parallel.
• Aehr expects to ship the new systems in the second half of 2026, aligning with accelerating AI data center deployments and the rapid expansion of optical connectivity solutions.
• The FOX-XP platform aids in the burn-in, reliability qualification, and screening of silicon photonics ICs, particularly important for high-volume data center and high uptime AI infrastructure.
• Silicon photonics is becoming critical for next-generation AI data centers, addressing performance and energy efficiency limitations posed by electrical I/O constraints.